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A scanning electron microscope uses electrons in order to make images. Its resolution is 1,000 times better than an ordinary light microscope. It utilizes a vacuum system and an optical electron for producing images. Discover the many components of a scanning electron microscope for a better understanding of how they function. The following are some things to keep in mind prior to purchasing your first microscope

Electron gun

The electronic gun is an component in a scanning electron microscope that creates beams. מיקרוסקופ אלקטרונים for the beam are dependent on an electron gun. The gun is particularly important for the fabrication of small electron-optical columns. Because of their brightness as well as their small size sources, field-emission cathodes can be used for fabricating such columns. The device can produce high threshold voltages that can reach 90 volts. It also produces high emissions and currents. They can reach a maximum output current of 90 uA.

The gun’s electronic circuit produces a focused electron beam. It emits electrons through an indirectly heated cathode. When is applied to an electrode, the electrons will be released. The intensity of beam is dependent on the current flowing through the electrodes. The gun is not able to emit electrons in broad beams, in contrast to the cathode. The beam produced by the electron gun is an extremely narrow, sharp and evenly focused beam.

Lenses with magnetic properties

One of the principal reason for using magnets for SEM is to increase contrast. The magnetic lenses cannot make the parallel electrons combine into one spot. There are various optical aberrations that can be caused by the lenses like the spherical and chromatic. But, they can be minimized by adjusting parameters of operation of the SEM. Here are some advantages as well as the drawbacks SEM magnets.

A common way SEM operates is to collect and analyze backscattered electrons. SEMs have higher energy of backscattered electrons. They could be utilized for imaging non-conductive materials. The specimen must be dried prior making use of the SEM. SEM is a highly effective instrument to conduct research in the field of materials science and is able to detect the chemical composition, morphology, topography, and the microstructure. SEM can also examine semiconductors and microchips.

Condenser lenses

Condenser lens are utilized within scanning electron microscopes (STEM). They control how strong the beam focused and direct it towards the sample. There are two types of condenser lenses: a single lens , which concentrates beams on the sample as well as a double lens that produce a diminished picture of the source. The double condenser lens is more affordable and flexible. The image can be adjusted to a desired size.

An electron column can be described as the result of a blend of condenser and source lens components. The two components form the convex lens with an angle, which concentrates electrons onto the sample. Convex lenses let electrons be accelerated through them, which creates a tight spiral. The angle and the current that flow through the lens are a factor in the flow of electrons in the lens.

Secondary electron detector

There are two types of detectors found in a scanner electron microscope (SEM). The primary electron detector detects the energy released from an object, while the secondary one detects the energy dispersion. When using a scanner electron microscope this is often used for materials that have a contrast that is hard to achieve using a standard detector. Apart from the main detector There are two kinds of secondary detectors: EDX and FEI spectroscopy.

This SE1 image depicts a part of shale. The SE1 signal comes from the surface of the sample . atomic absorption instruments is typically used to image surface details at high resolution but at the cost of compositional data. Contrarily, the SE2 image shows the results of greater landing energy and deeper interactions with the sample. The SE2 image, on the other hand displays compositional data as well as has a higher resolution. The two types of SEMs differ and each has distinct strengths and flaws.


A scanning electron microscope can be used in computer applications to reap its numerous benefits. A microscope needs stable supply of power and cool. Also, it requires an environment with a low noise. A beam of electrons is employed for tracing the samples by using SEMs. The process begins by using an electron gun. טיטרטורים are electromagnetic lenses which focus the electron beam onto the surface of the object. These lenses also enhance the speed of the electron beam as it goes across the surface of the specimen.

SEM accelerates an electron beam using a high voltage system. The beam is then narrowed with a series of coils called scan coils which are placed along the surface of the specimen. Once the beam is in contact with the material, signals from the interaction are generated, such as secondary electrons or backscattered electrons or the characteristic X-rays. The data is then processed into pictures.